Defect Detection Capability of Delay Tests for Path Delay Faults
نویسنده
چکیده
Defects cause faulty static logic behaviour, faulty dynamic logic behaviour and elevated I DDQ levels. Recent empirical and simulation studies show that adding at speed tests to test suites detects defective ICs missed by slow speed and I DDQ tests. Delay tests for path delay faults and transition tests are two classes of tests that are often used for isolating ICs with faulty dynamic logic behaviour. We show that both these classes of tests often fail to detect many defects that causes faulty dynamic faulty behaviour. This implies that computing at speed tests is fundamentally diierent from computing delay tests for parametric testing and new techniques need to be developed.
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